1. Advanced test methods for SRAMs: <effective solutions for dynamic fault detection in nanoscaled technologies>
المؤلف: / by Alberto Bosio ... [et al.]
المکتبة: المكتبة المركزية ومركز الأرشيف (طهران)
موضوع: Random access memory,-- Testing
رده :
621
.
3973
A244
2010
2. #MTDT 2004
المؤلف: #edited by R. Rajsuman and T. Wik , sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council ... and others
المکتبة: کتابخانه مرکزی دانشگاه صنعتی اصفهان (أصبهان)
موضوع: Semiconductor storage devices- Testing- Congresses ،Random access memory- Congresses
رده :
#
TK
،#.
M4
,
I334
،#
2004
3. Proceedings: International Workshop on Memory Technology, Design, and Testing
المؤلف: / edited by F. Lombardi, R. Rajsuman, and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI; in cooperation with IEEE Solid State Circuits Council
المکتبة: المكتبة المركزية ومركز الأرشيف (طهران)
موضوع: Semiconductor storage devices,Random access memory,-- Testing Congresses,-- Congresses
رده :
621
.
39732
I11P
1997
4. Records of the ... IEEE International Workshop on Memory Technology, Design, and Testing
المؤلف:
المکتبة: كتابخانه مركزی دانشگاه صنعتی شریف (طهران)
موضوع: ، Semiconductor storage devices-- Testing-- Congresses,، Random access memory-- Congresses
رده :
TK
7895
.
M4
.
I335
5. Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, 7-8 August 2000, San Jose, California
المؤلف: edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI; in cooperation with IEEE Solid State Circuits Society
المکتبة: کتابخانه مرکزی و مرکز اطلاع رسانی دانشگاه فردوسی مشهد (خراسان رضوی)
موضوع: Testing -- Congresses ، Semiconductor storage devices,Congresses ، Random access memory
رده :
TK
7895
.
M4
I334
2000
6. Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
المؤلف: IEEE International Workshop on Memory Technology, Design, and Testing )1994 : San Jose, Calif.(
المکتبة: (طهران)
موضوع: Semiconductor storage devices - Testing - Congresses , Random access memory - Congresses
رده :
TK
7895
.
M4
I334
1994
7. Records of the 1999 IEEE International Workshop on memory Technology, Design and Testing, August 9-10, 1999, San Jose, Calif., USA
المؤلف: edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology; in cooperation with the IEEE Solid-State Circuits Society
المکتبة: (طهران)
موضوع: Testing -- Congresses ، Semiconductor storage devices,Congresses ، Random access memory
رده :
TK
7895
.
M4I44
1999
